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Investigation of Wafer Strength in 12 inch Bare Wafer for Prevent Wafer Breakage

机译:防止晶片破裂的12英寸裸晶片晶片强度的研究

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It is well known that silicon was belonging to a hard and easy breakage (brittle) material. Beside, the trend in wafer size increasing of the microelectronics circuits has been driven by modern IC manufacturing technology. In other words, wafer broken is
机译:众所周知,硅属于坚硬易碎的(脆性)材料。此外,现代电子制造技术推动了微电子电路晶片尺寸增加的趋势。换句话说,破损的晶片是

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