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Fabrication of Thin-Film Transistors on Plastic Substrates by Spin Etching and Device Transfer Process

机译:通过旋转刻蚀和器件转移工艺在塑料基板上制造薄膜晶体管

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摘要

This work presents a novel method to transfer thin-film transistors from a Si wafer to another flexible plastic substrate. First, high-performance poly-Si TFTs were fabricated on 1-μm thick SiO_2 of a Si wafer and then adhered to a flexible plastic substrate by the optical adhesive. Next, the spin-etching process was utilized to. remove the backside Si with SiO_2 as a stopping layer. We have established a qualitative model to explain the relation between the chemical flow rate/rotation speed to the etching rate and the uniformity of Si removal. The Si etching rate is higher than 200 μm/min while maintaining Si to SiO_2 selectivity of 250 under optimized spin-etching parameters. Compared to that before transference, no degradation or yield loss was found due to substrate bonding and Si spin-etching steps. Additionally, extrinsic stress shows little effect to the properties of poly-Si resistors on the flexible plastic substrate.
机译:这项工作提出了一种将薄膜晶体管从Si晶圆转移到另一个柔性塑料基板的新颖方法。首先,在1微米厚的Si晶片的SiO_2上制造高性能的多晶硅TFT,然后通过光学粘合剂将其粘附到柔性塑料基板上。接下来,利用旋转蚀刻工艺。用SiO 2作为终止层去除背面Si。我们建立了一个定性模型来解释化学流速/旋转速度对蚀刻速度与硅去除均匀性之间的关系。在优化的自旋刻蚀参数下,Si刻蚀速率高于200μm/ min,同时保持Si对SiO_2的选择性为250。与转移之前相比,没有发现由于基板键合和Si自旋蚀刻步骤而导致的降解或成品率下降。此外,外部应力对柔性塑料基板上的多晶硅电阻的性能影响很小。

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