首页> 外文会议>Conference on Emerging Lithographic Technologies Ⅴ Feb 27-Mar 1, 2001, Santa Clara, USA >Thick silicon membranes as mask blank for SU-8 X-ray deep lithography
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Thick silicon membranes as mask blank for SU-8 X-ray deep lithography

机译:厚硅膜作为SU-8 X射线深光刻的掩模坯

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Home made masks having thick (35-50 μm) silicon membranes as blanks were used in deep X-ray lithography of SU8 - a negative tone photoresist. X-ray masks were fabricated by the following sequence of steps: (a) vacuum deposition of Ti and Au thin layers on a 220 μm thick (100) silicon wafer, (b) optical lithography of two different patterns in both negative (SU-8) or positive (AZ4620) photoresist (c) gold electroforming and (d) silicon substrate thinning with KOH etch to form the membrane. X-ray exposures was performed in the X-ray beam line of the LNLS synchrotron light source. The samples consisted of 125 !!m thick layers of SU-8 supported on silicon and assorted substrates. The optimum dose for silicon substrates have been used in the remaining substrates, namely, metallic thin films (Cr, Cu, Au, Pt), printed circuit board (PCB), quartz, alumina ceramic and glass. The influence of mask defects, substrate type and X-ray dose values on the lithography of SU-8 is discussed. Criteria for defining upper and lower dose values for SU-8 X-ray deep lithography was proposed on the basis of characteristic defects. Advantages in using SU-8 rather than PMMA in the LIGA technology are commented
机译:SU8(负性光刻胶)的深X射线光刻中使用具有厚(35-50μm)硅膜作为空白的自制掩模。 X射线掩模是通过以下步骤序列制造的:(a)在220μm厚的(100)硅晶片上真空沉积Ti和Au薄层,(b)两种负片(SU- 8)或正片(AZ4620)光刻胶(c)电铸金,以及(d)用KOH蚀刻减薄硅衬底以形成膜。在LNLS同步加速器光源的X射线束线中进行X射线曝光。样品包括125微米厚的SU-8层,支撑在硅和各种衬底上。硅基板的最佳剂量已用于其余基板中,即金属薄膜(Cr,Cu,Au,Pt),印刷电路板(PCB),石英,氧化铝陶瓷和玻璃。讨论了掩模缺陷,衬底类型和X射线剂量值对SU-8光刻的影响。基于特征缺陷,提出了定义SU-8 X射线深光刻的上下剂量值的标准。评论了在LIGA技术中使用SU-8而不是PMMA的优势

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