首页> 外文会议>Computational Electronics, 2009. IWCE '09 >Correction to the Schenk Model of Band-to-Band Tunneling in Silicon Applied to the Simulation of Nanowire Tunneling Transistors
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Correction to the Schenk Model of Band-to-Band Tunneling in Silicon Applied to the Simulation of Nanowire Tunneling Transistors

机译:硅中带间隧穿Schenk模型的校正在纳米线隧穿晶体管仿真中的应用

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We found out that the standard form of Schenk's model of band-to-band tunneling in silicon involves a poor approximation of the Airy-Integral and, therefore, overestimates the channel currents of realistic tunneling devices. In this paper we propose a better approximation resulting in a corrected form of the model, and we demonstrate its impact on the device characteristics of a tunneling transistor. Additionally, we investigated the influence of the corrected model on the local density correction and quantum confinement.
机译:我们发现,Schenk的硅带间隧穿模型的标准形式涉及到Airy-Integral的较差近似值,因此高估了实际隧穿器件的沟道电流。在本文中,我们提出了一种更好的近似方法,从而得到了模型的更正形式,并证明了其对隧穿晶体管器件特性的影响。此外,我们研究了校正模型对局部密度校正和量子约束的影响。

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