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Structure-property relationship in acetal-based chemically amplified three-component DUV resist

机译:缩醛基化学放大三组分DUV抗蚀剂的结构-性质关系

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Abstract: AZ DX series are chemically amplified, three componentresists based on apoly(4-hydroxystyrene-co-3-methyl-4-hydroxystyrene)matrix resin, a poly(N,O-acetal) dissolution inhibitor,and a bis(arylsulfonyl)diazomethane acid generator. Thepreviously described AZ DX 46 is an environmentally anddelay time stable, high performance resist capable oflineating structures down to 0.23 $mu@m. The materialcontains a photoactive base to reduce the delay timeeffects. In this paper the influence of styrene unitsin the matrix resin, and some new polyacetals on theperformance of the resist in comparison to the abovementioned standard formulation AZ DX 46. !8
机译:摘要:AZ DX系列是化学扩增的,基于聚(4-羟基苯乙烯-co-3-甲基-4-羟基苯乙烯)基质树脂,聚(N,O-乙缩醛)溶解抑制剂和双(芳基磺酰基)的三组分抗蚀剂重氮甲烷酸发生器。先前描述的AZ DX 46是一种对环境和延迟时间稳定的高性能抗蚀剂,能够勾勒低至0.23μm的结构。该材料包含光敏碱,以减少延迟时间。与上述标准配方AZ DX 46相比,本文中基体树脂中苯乙烯单元和一些新的聚缩醛对抗蚀剂性能的影响。8

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