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Solder Joint Fatigue Life Prediction of Electronic Packages Using Combined FEA and Peridynamics

机译:结合有限元分析和围力学来预测电子封装的焊点疲劳寿命

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摘要

A new analysis method for solder joint fatigue life prediction is introduced. The method utilizes a combination of finite element method (FEM) and peridynamic (PD) theory. The thermal cycle simulation is performed using FEM to obtain deformation field, which is imposed as boundary conditions to the PD model. Fatigue crack initiation and its progression is captured in PD simulations. The approach is demonstrated on five packages. Qualitative and quantitative results of the PD analyses are shown. The life predictions based on FEM for all packages as well as predictions using PD on two packages are presented.
机译:介绍了一种预测焊点疲劳寿命的新分析方法。该方法结合了有限元方法(FEM)和周边动力学(PD)理论。使用FEM进行热循环仿真以获得变形场,该变形场被作为PD模型的边界条件。在PD模拟中捕获了疲劳裂纹的萌生及其进展。该方法在五个软件包中进行了演示。显示了PD分析的定性和定量结果。给出了基于FEM的所有包装的寿命预测以及两个包装上使用PD的寿命预测。

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