首页> 外文会议>2014 IEEE International Meeting for Future of Electron Devices, Kansai >Postgrowth annealing effects on structural, optical, and electrical properties of #x03B2;-MoO3 films grown by molecular beam epitaxy
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Postgrowth annealing effects on structural, optical, and electrical properties of #x03B2;-MoO3 films grown by molecular beam epitaxy

机译:生长后退火对分子束外延生长的β-MoO 3 薄膜的结构,光学和电学性质的影响

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摘要

We report the postgrowth annealing effects on the structural, optical, and electrical properties of a low-temperature grown β-phase MoO3 film on a c-plane sapphire substrate by molecular beam epitaxy. By employing the postgrowth annealing at 600°C in an oxygen atmosphere, the film was completely transformed from β-phase to thermo-dynamically stable α-phase. On the other hand, oxygen deficient MoO3−x domains were introduced into the film by the annealing at the same temperature in a nitrogen atmosphere. The latter film exhibited a high absorbance in a visible region accompanied by a decrease in resistivity.
机译:我们通过分子束外延报告了生长后退火对低温生长的β相MoO3薄膜在c面蓝宝石衬底上的结构,光学和电学性质的影响。通过在氧气气氛中在600℃下进行后生长退火,膜完全从β相转变为热力学稳定的α相。另一方面,通过在氮气氛中在相同温度下的退火将缺氧的MoO3-x畴引入膜中。后者的膜在可见光区显示出高吸收率,同时电阻率降低。

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