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A novel study of mold compound effect towards TCoB and process integration for power leadless package

机译:功率化合物无铅封装对TCoB的模塑料影响和工艺集成的新研究

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Solder joint crack in thermal cycling on board (TCoB) for surface mount devices (SMD) is becoming more stringent in semiconductor market. Current TCoB literature mainly focuses on Finite Element Analysis simulation with ANSYS software to identify the most sensitive parameters affecting TCoB performance and estimating the solder fatigue life. By a given Driver Mosfet Power QFN, this paper is focusing on actual TCoB by modifying mold compound's coefficient of thermal expansion (CTE) and storage modulus by altering the filler loading percentage and adding in additive either stress relief additive (SRA) or silicone. These modifications reduce mold compound viscosity, increase CTE1, mold shrinkage potentially increases challenges in wire sweep and map molding panel warpage. Six different mold compounds are assembled and soldered on a PCB board with TCoB condition of -40°C to 125°C. The judging criteria is concentrating on solder joint crack. Package level reliability MSL3@260°C, 500 cycle TC(-65/150°C) and 96h PCT are evaluated. Material analysis of Thermal Mechanical Analysis (TMA) and Dynamic Mechanical Analysis (DMA) are employed to analyze the coefficient of thermal expansion (CTE), glass transition temperature (Tg) and storage modulus of six different mold compounds. Filler loading reduction increase liquid to solid particles ratio, therefore wire sweep and process mapping result for all mold compounds are comparable. Increment of resin induce criticalness of panel warpage as mold shrinkage increases, result shows that filler content ≤87wt% increases panel warpage > 0.7mm which increase the difficulty in package singulation. Experimental TCoB reviews that corner leads are subjected to the highest thermal mechanical stress and becomes the initiation point of solder joint crack. Result further validates storage modulus is primary factor of mold compound instead of CTE1. Higher solder joint thickness ≥34μm i- sufficient to prevent solder joint crack and meet TCoB requirement.
机译:在半导体市场上,用于表面安装器件(SMD)的板载热循环(TCoB)中的焊点裂纹越来越严格。当前的TCoB文献主要集中在使用ANSYS软件进行有限元分析仿真中,以识别影响TCoB性能并估计焊料疲劳寿命的最敏感参数。通过给定的Driver Mosfet Power QFN,本文着眼于实际的TCoB,方法是通过改变填料的填充百分比并添加应力消除添加剂(SRA)或硅酮,来改变模塑化合物的热膨胀系数(CTE)和储能模量。这些修改降低了模塑料的粘度,增加了CTE1,模收缩可能增加扫线和地图成型板翘曲方面的挑战。在TCoB条件为-40°C至125°C的PCB板上组装并焊接六种不同的模塑料。评判标准集中在焊点裂纹上。评估了包装级别的可靠性MSL3 @ 260°C,500循环TC(-65 / 150°C)和96h PCT。使用热力学分析(TMA)和动态力学分析(DMA)的材料分析来分析六种不同模塑料的热膨胀系数(CTE),玻璃化转变温度(Tg)和储能模量。减少填料填充量增加了液固颗粒的比例,因此所有模塑料的扫丝和工艺映射结果都是可比的。树脂的增加会随着模具收缩率的增加而引起面板翘曲的临界,结果表明,填料含量≤87wt%会增加面板翘曲> 0.7mm,这增加了封装分割的难度。实验性TCoB指出,角线引线承受最高的热机械应力,并成为焊点裂纹的起始点。结果进一步验证了储能模量是模塑料而不是CTE1的主要因素。更高的焊点厚度≥34μm,足以防止焊点破裂并满足TCoB要求。

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