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Applications of Ag-alloy stud bump for IC and LED packages

机译:银合金凸块在IC和LED封装中的应用

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摘要

Recently, 3-D IC and 2.5-D IC packages become more popular and Cu pillars are often employed as their conductive bumps. However, since the Cu pillars are hard and rigid, it is difficult to plastically deform for the solid contact between the Cu pillars and bonding pads during the assembly process utilizing hot pressing. In this case, a coplanar problem may occur, which leads to voids or even failure at the bonding interfaces. The Ag-alloy wires previously developed by Wire Technology Co., LTD., have been further manufactured as stud bumps for flip-chip interconnections. This innovative Ag alloy stud bump is softer, so it is able to plastically deform during hot pressing to be in solid contact with the on-substrate bonding pad, preventing the coplanar problem of Cu pillars in 3D- or 2.5D-IC packages. The Ag-alloy stud bumps also exhibit many other advantages for applications in advanced IC and high power flip chip packages as comparing with the conventional Au- or Cu- stud bumps.
机译:最近,3-D IC和2.5-D IC封装变得越来越流行,并且铜柱通常被用作其导电凸块。然而,由于铜柱坚硬且刚性,因此在利用热压的组装过程中,铜柱与接合垫之间的固体接触难以塑性变形。在这种情况下,可能会发生共面问题,从而导致键合界面出现空隙甚至失效。先前由Wire Technology Co.,LTD。开发的Ag合金线已经进一步制造为用于倒装芯片互连的柱形凸点。这种创新的Ag合金螺柱凸点更柔软,因此能够在热压过程中发生塑性变形,使其与基板上的焊盘牢固接触,从而避免了3D或2.5D-IC封装中Cu柱的共面问题。与传统的Au或Cu柱形凸块相比,Ag合金柱形凸块在先进的IC和高功率倒装芯片封装中还具有许多其他优势。

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