Inf. Intell. Syst., Fukuoka Inst. of Technol. Wajiro-Higashi, Fukuoka, Japan;
SRAM chips; deconvolution; gradient methods; maximum likelihood estimation; MATLAB; RDF; RTN effects; deconvolution algorithm dependencies; estimation errors; fail-bit-count error; maximum-likelihood gradient sequence; random dopant fluctuation; random telegraph noise; subnanoscaled SRAM margin variation; Convolution; Deconvolution; MATLAB; Noise; Probability density function; Random access memory; Resource description framework; Deconvolution; MATLAB-deconvolution function; Random telegraph noise; SRAM margin variatio;
机译:RTN容错SRAM筛选测试设计,高斯混合近似长尾分布
机译:老化效应和制造偏差对SRAM软错误率的影响
机译:阅读考虑FinFET SRAM的SBD和BTI效应的静态噪声裕量老化模型
机译:Deconvolulate算法依赖于rTN效果对亚纳纳级SRAM边距变化的估计误差
机译:快速最小化总变化的算法,应用于图像去卷积和压缩传感
机译:用变分贝叶斯算法估计上位性的数量性状轨迹效应。
机译:基于长尾分布近似模型的RTN容错保护带设计的讨论,用于纳米尺度SRAM筛选
机译:自适应输出误差估计算法的有界性和非线性效应研究