APPARATUS AND METHOD FOR ESTIMATION OF SRAM PERFORMANCE MARGIN USING WORST CASE SAMPLING

摘要

The present invention relates to an SRAM performance margin evaluating device for sampling the worst case and a method thereof. The device comprises: an input unit configured to receive I_DLIN, I_DSAT, I_HIGH, I_LOW, I_OFF, V_TLIN, and V_TSAT values; a power transforming unit configured to generate an element sample; a sample generating unit configured to generate an SRAM bit cell sample; a measure calculating unit configured to calculate at least one of a WWTV and a WRRV of the SRAM bit cell sample; and a margin evaluating unit configured to calculate at least one of an RSNM and I_W. Therefore, the device drastically reduces calculation complexity of a simulation.