School of Material and Energy, Guangdong University of Technology, Guangzhou 510006, China Science and Technology Laboratory on Reliability Physics and Application of Electronic Component, CEPREI,Guangzhou 510610, China;
Science and Technology Laboratory on Reliability Physics and Application of Electronic Component, CEPREI,Guangzhou 510610, China;
Science and Technology Laboratory on Reliability Physics and Application of Electronic Component, CEPREI,Guangzhou 510610, China;
机译:通过每个焊点的应变能密度(SED)的变化对双芯片堆叠封装的焊点可靠性进行包装参数分析和优化设计
机译:球栅阵列封装组件热界面材料的湿热力学可靠性评估
机译:多管芯叠层封装中的硅通孔的可靠性评估
机译:湿热机械应力对叠层芯片封装可靠性的影响
机译:堆叠式模具封装的最佳热管理:可堆叠性设计
机译:栅堆叠结构和工艺缺陷对32 nm工艺节点PMOSFET中NBTI可靠性的高k介电依赖性的影响
机译:基于虚拟原型和可靠性测试的包装堆叠模具的设计规则