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Packaging parameter analysis and optimization design on solder joint reliability for twin die stacked packages by variance in strain energy density (SED) of each solder joint

机译:通过每个焊点的应变能密度(SED)的变化对双芯片堆叠封装的焊点可靠性进行包装参数分析和优化设计

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摘要

In accordance with vigorous development of the electronic product market as well as the consumers' preference for smaller scales, the structure of 3D stacked die package rapidly becomes popular. Hereafter the stacked process of the silicon dies always mak
机译:随着电子产品市场的蓬勃发展以及消费者对小尺寸的偏爱,3D堆叠裸片封装的结构迅速流行。此后,硅芯片的堆叠过程总是麦

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