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SEMICONDUCTOR PACKAGE AND A STACKED PACKAGE USING THE SAME, CAPABLE OF IMPROVING THE ELECTRICAL AND THE PHYSICAL RELIABILITY OF THE STACKED PACKAGE

机译:半导体包装和使用相同包装的包装,能够提高包装的电气和物理可靠性

摘要

PURPOSE: A semiconductor package and a stacked package using the same are provided to minimize the length of exposed wirings by forming an insulation layer on the upper side of a scribe lane.;CONSTITUTION: A semiconductor chip includes a part of a scribe lane(110b). A plurality of bonding pads(114) is formed on the upper side of the semiconductor chip. A first insulation layer(118) is formed on the semiconductor chip in order to expose the bonding pads. Wirings(120) are arranged on the first insulation layer and are connected to the bonding pads. A second insulation layer(122) exposes a part of the wirings. The edge of the second insulation layer is expanded to the scribe lane.;COPYRIGHT KIPO 2010
机译:目的:提供一种半导体封装和使用该封装的堆叠封装,以通过在划片道的上侧形成绝缘层来最大程度地减少裸露的布线的长度。;组成:半导体芯片包括一部分划片道(110b) )。在半导体芯片的上侧形成有多个焊盘(114)。在半导体芯片上形成第一绝缘层(118),以暴露出焊盘。布线(120)布置在第一绝缘层上并连接至接合垫。第二绝缘层(122)暴露一部分布线。第二绝缘层的边缘扩展到划线道。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100051337A

    专利类型

  • 公开/公告日2010-05-17

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20080110455

  • 发明设计人 CHO IL HWAN;NAM JONG HYUN;CHUNG QWAN HO;

    申请日2008-11-07

  • 分类号H01L23/12;H01L23/28;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:46

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