University of Massachusetts, Lowell, MA, USA;
Massachusetts Toxics Use Reduction Institute (TURI), Lowell, MA, USA;
Cobham, Lowell, MA, USA;
Cobham, Lowell, MA, USA;
Benchmark Electronics, Hudson, NH, USA;
DDi Incorporated, Anaheim, CA, USA;
DDi Incorporated, Anaheim, CA, USA;
Teradyne Inc., North Reading, MA, USA;
Texas Instruments, Attleboro, MA, USA;
Tewksbury, MA, USA;
Tewksbury, MA, USA;
Tewksbury, MA, USA;
Tewksbury, MA, USA;
Wilmington, MA, USA;
Wilmington, MA, USA;
EMC, Hopkinton, MA, USA;
EMC, Hopkinton, MA, USA;
Wall Industries, Exeter, NH, USA;
lead free; visual inspection; rework; reliability testing; thermal cycling; design of experiments;
机译:在各种锡铅焊接工艺条件下组装的无铅区域阵列封装的焊点特性和可靠性
机译:无铅焊锡材料和焊锡掩模尺寸不同设计的倒装芯片球栅阵列元件的焊点可靠性评估
机译:无铅焊锡材料和焊锡掩模尺寸不同设计的倒装芯片球栅阵列元件的焊点可靠性评估
机译:电路板的质量和可靠性测试组装在模拟生产条件下的无铅部件,饰面,焊接材料和过程中
机译:使用无铅焊接材料,无卤素层压板材料以及纳米材料的表面光洁度进行电子组装,返工和可靠性评估。
机译:在长期老化和循环下的板级热测试中ENIG和ENEPIG表面处理的包装可靠性影响
机译:无铅焊接:材料科学和焊接联合可靠性