首页> 外国专利> METHOD AND DEVICE FOR MACHINING A WAFER-HOLDING DEVICE FOR A WAFER LITHOGRAPHY PROCESS

METHOD AND DEVICE FOR MACHINING A WAFER-HOLDING DEVICE FOR A WAFER LITHOGRAPHY PROCESS

机译:用于加工用于晶圆光刻工艺的晶圆保持装置的方法和装置

摘要

The invention relates to a method for machining a wafer-holding device (10) for a wafer lithography process, such as immersion lithography or lithography under vacuum conditions, the wafer-holding device (10) comprising a carrier body (11) having an electrically conductive diamond cover layer (12). An electrochemical cell (20) is formed on the wafer-holding device (10) by the diamond cover layer (12), a counter electrode (21), an electrolyte liquid (22) in a gap between the diamond cover layer (12) and the counter electrode (21), and a voltage source (23) which is electrically connected to the diamond cover layer (12) and the counter electrode (21). Material is removed electrochemically on the wafer-holding device by means of the electrochemical cell (20). The invention also relates to a surface machining device (200) which is designed to machine a wafer-holding device (10) for a wafer lithography process.
机译:本发明涉及用于晶圆光刻工艺(例如浸入式光刻或真空条件下的光刻)的晶圆保持装置(10)的加工方法,该晶圆保持装置(10)包括具有导电金刚石覆盖层(12)的载体体(11)。电化学电池(20)由金刚石覆盖层(12)、反电极(21)、位于金刚石覆盖层(12)和反电极(21)之间的间隙中的电解质液体(22)以及电连接到金刚石覆盖层(12)和反电极(21)的电压源(23)形成在晶片保持装置(10)上。通过电化学电池(20)在晶片保持装置上以电化学方式去除材料。本发明还涉及一种表面加工装置(200),其设计用于加工用于晶圆光刻工艺的晶圆保持装置(10)。

著录项

  • 公开/公告号WO2022053327A1

    专利类型

  • 公开/公告日2022-03-17

    原文格式PDF

  • 申请/专利权人 ASML NETHERLANDS B.V.;

    申请/专利号WO2021EP73640

  • 发明设计人 WEBER CONSTANS;

    申请日2021-08-26

  • 分类号G03F7/20;H01L21/687;C25F1;

  • 国家 EP

  • 入库时间 2024-06-14 22:50:26

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