首页> 外国专利> Particle detection systems and methods for on-axis particle detection and/or differential detection

Particle detection systems and methods for on-axis particle detection and/or differential detection

机译:用于轴上粒子检测和/或差分检测的粒子检测系统和方法

摘要

Optical systems and methods for detecting and characterizing particles are provided herein. Systems and methods are provided that increase the sensitivity of optical particle counters and enable the detection of smaller particles while analyzing larger fluid volumes. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (eg, less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large quantities of analyzed fluids.
机译:本文提供了用于检测和表征粒子的光学系统和方法。 提供了系统和方法,其提高了光学粒子计数器的灵敏度,并在分析更大的流体容积时能够检测较小的颗粒。 对于大量分析的流体,所描述的系统和方法允许纳米级颗粒的敏感和准确的检测和尺寸表征纳米级颗粒(例如,少于50nm,可选地小于20nm,可选地小于10nm)。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号