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PARTICLE DETECTION SYSTEMS AND METHODS FOR ON-AXIS PARTICLE DETECTION AND/OR DIFFERENTIAL DETECTION
PARTICLE DETECTION SYSTEMS AND METHODS FOR ON-AXIS PARTICLE DETECTION AND/OR DIFFERENTIAL DETECTION
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机译:用于轴上粒子检测和/或微分检测的粒子检测系统和方法
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摘要
Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.
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