首页> 外国专利> PARTICLE DETECTION SYSTEMS AND METHODS FOR ON-AXIS PARTICLE DETECTION AND/OR DIFFERENTIAL DETECTION

PARTICLE DETECTION SYSTEMS AND METHODS FOR ON-AXIS PARTICLE DETECTION AND/OR DIFFERENTIAL DETECTION

机译:用于轴上粒子检测和/或微分检测的粒子检测系统和方法

摘要

Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.
机译:本文提供了用于检测和表征颗粒的光学系统和方法。提供了增加光学粒子计数器的灵敏度并允许在分析较大的流体量的同时检测较小的粒子的系统和方法。所描述的系统和方法允许对大量分析流体进行纳米级颗粒(例如,小于50nm,可选地小于20nm,可选地小于10nm)的灵敏和准确的检测和尺寸表征。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号