Semiconductor integrated circuits, timing controllers, and display devices

摘要

PROBLEM TO BE SOLVED: To detect abnormalities in differential transmission lines.SOLUTION: A semiconductor integrated circuit 100 is connected with another circuit via differential transmission lines of N channels CH1 to CHN. Each of N differential transmitters 10 drives the differential transmission line 3 of the corresponding channel via a corresponding differential output pin OUTP/OUTN. An abnormality detection circuit 20 detects abnormalities generated in the differential transmission lines 3 of the N channels. Each of N amplifiers AMP1 detects a potential difference of the differential transmission line 3 of the corresponding channel. Each of N first comparators CMP1 compares an output voltage Vof the corresponding amplifier AMP1 with a predetermined first threshold voltage V. A logic circuit 24 detects abnormalities of a first mode in the differential transmission line 3 of the corresponding channel on the basis of an output of each of the N first comparators CMP1.SELECTED DRAWING: Figure 3