SLIDING THIN FILM RESISTANCE FOR MEASURING INSTRUMENTS

• 1. 电阻体材料、电阻薄膜形成用溅射靶、电阻薄膜、薄膜电阻器以及它们的制造方法 [P] . 中国专利： CN102117670B . 2016.05.04
• 2. 电阻体材料、电阻薄膜形成用溅射靶、电阻薄膜、薄膜电阻器以及它们的制造方法 [P] . 中国专利： CN102117670A . 2011-07-06
• 3. THIN FILM THERMOPHYSICAL PROPERTY MEASURING INSTRUMENT AND METHOD OF MEASURING THERMAL CONDUCTIVITY AND INTERFACE THERMAL RESISTANCE USING THIS MEASURING INSTRUMENT [P] . 日本专利： JP2010243482A . 2010-10-28

  机译： 薄膜热物理性质测量仪器以及使用该测量仪器测量热导率和界面热阻的方法

• 4. X-RAY MEASURING INSTRUMENT, THIN FILM MEASURING AND FORMING SYSTEM, AND THIN FILM MEASURING AND FORMING METHOD [P] . 世界知识产权组织专利： WO03029798A1 . 2003-04-10

  机译： X射线测量仪器，薄膜测量成形系统以及薄膜测量成形方法

• 5. MEASURING METHOD OF THIN FILM, MEASURING INSTRUMENT OF THIN FILM AND CONTACT SENSOR USED THEREIN [P] . 日本专利： JP2007071553A . 2007-03-22

  机译： 薄膜的测定方法，薄膜的测定仪器及所使用的接触式传感器

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• 1. Design of TE_(01δ) Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film [J] . Cheng Zeng Zheng-Xiang Luo Qi-Shao Zhang Kai Yang . 中国电子科技：英文版 . 2008,第2期
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• 3. 电阻应变测量仪器的技术指标、检定方法及其应用 [C] . 沈观林 . 第19届全国结构工程学术会议 . 2010
• 4. 随钻电磁波电阻率测量仪器数值模拟方法研究 [A] . 张旭 . 2010