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Method for removal of minute physical damage to silicon wafers by employing laser annealing

机译:通过激光退火去除对硅晶片的微小物理损伤的方法

摘要

In order to produce wafers suitable for fabrication of integrated circuits, an ingot of raw silicon must undergo a process which includes several steps. The ingot must be sawed into slices, the slices edge ground to remove roughness of the edges, lapped to remove as much saw damage as possible, stress relief etched to remove as small a damaged area as possible, then polished. Each of these steps requires removal of some of the material of the slice. The use of laser annealing reduces the amount of surface removed, as it repairs some surface damage, smoothes the surface, and when accomplished in a partial vacuum, improves the chemical composition of the material as related to electrical activity.
机译:为了生产适用于集成电路制造的晶片,原始硅锭必须经历包括几个步骤的过程。必须将铸锭锯成薄片,将薄片的边缘打磨以消除边缘的粗糙度,研磨以消除锯齿的尽可能多的损伤,蚀刻应力消除以除去尽可能小的损伤区域,然后进行抛光。这些步骤中的每一个都需要去除切片的一些材料。激光退火的使用减少了去除的表面数量,因为它修复了一些表面损伤,使表面光滑,并且当在部分真空中完成时,改善了与电活动有关的材料的化学组成。

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