1. Beam deflector for an optical instrument, particularly a microscope of a random type, in order to observe an object from directions diverging from a normal optical path substantially given by the optical axis of the instrument, said deflector having two reflecting faces (6, 7), which can be brought into the normal optical path, characterized in that the two reflecting faces (6, 7) are so arranged as regards position and spacing with respect to one another in a casing (2), that in the position for the deflected optical path, its optical axis (4') and the optical axis of the normal optical path (4) intersect at a point (8), said intersection point being the axial object point of the optical system of one of the two optical paths, that optical means (16, 17) are provided in casing (2) making said intersection point (8) also the axial object point of the optical system of the other optical path, in that either : a) the optical means are constituted by a negative member (17) or a plane-parallel plate (16), which is arranged in the vicinity of the deflected optical path or b) the optical means are constituted by a positive member (18) arranged in the object-side area of the normal optical path, or c) the optical means are two main lenses (3, 31), whereof one is associated with the normal optical path and one is associated with the object side area of the deflected optical path.
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