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Method of growing III-V semiconductor layers with high effective hole concentration

机译:生长具有高有效空穴浓度的III-V半导体层的方法

摘要

36 We have discovered the III-V semiconductor layers with previously unattainably high effective hole concentrations can be produced by molecular growth processes (e.g. MBE) if an amphoteric dopant such as Be is used and if, during the growth of the highly doped III-V layer, the substrate is maintained at a temperature T.sub.g that is substantially lower than customarily used. For instance, a InGaAs layer with effective hole concentration 1.0×10.sup.20 cm.sup.-3 was grown at T.sub.g =450° C., and a GaAs layer with effective hole concentration of 1. 0×10.sup.20 cm.sup.-3 was grown at T.sub.g of 475° C. The heavily doped III-V layers can be of device grade and can usefully be part of electronic devices such as high speed bipolar transistors.
机译:36我们发现,如果使用两性掺杂剂(如Be)以及在高掺杂的III-V的生长过程中,则可以通过分子生长工艺(例如MBE)来生产出具有以前无法达到的高有效空穴浓度的III-V半导体层。在第二层中,衬底被保持在实质上低于通常使用的温度TG。例如,在Tg = 450℃下生长具有有效空穴浓度为1.0×10 20厘米3的InGaAs层,并且具有有效空穴浓度为1. 0×的GaAs层。在475°C的温度下生长10sup.20 cms.sup.-3。重掺杂的III-V层可以是器件级的,并且可以有效地用作电子器件的一部分,例如高速双极晶体管。

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