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MOLECULAR BEAM EPITAXY METHOD AND COMPOUND SEMICONDUCTOR FILM

机译:分子束外延法和复合半导体膜

摘要

PURPOSE: To provide a compound semiconductor film having slight incorporation of impurity carbon in molecular beam epitaxy method using a gas as a raw material for molecular beam, in a compound semiconductor film produced by this method and in molecular beam epitaxy method suppressing incorporation of impurity carbon in the compound semiconductor film. ;CONSTITUTION: An organometallic raw material gas is preheated and decomposed in a molecular beam cell 10, a substrate 15 is irradiated with the decomposed gas and epitaxial growth is carried out to provide a compound semiconductor film. Since the bond between a metal atom and carbon atom in the organometallic molecule is completely cleft and there is no carbon atom which is linked to a metal atom and incorporated with the compound semiconductor film, the method has effects on improving purity of compound semiconductor.;COPYRIGHT: (C)1993,JPO&Japio
机译:用途:提供一种在使用气体作为分子束原料的分子束外延方法中,在以此方法生产的化合物半导体膜中以及在抑制杂质碳掺入的分子束外延方法中,杂质碳几乎不掺入的化合物半导体膜在化合物半导体膜中。组成:有机金属原料气体在分子束单元10中预热并分解,用分解后的气体辐照衬底15,并进行外延生长以提供化合物半导体膜。由于有机金属分子中的金属原子与碳原子之间的键被完全裂开,并且不存在与金属原子连接并与化合物半导体膜结合的碳原子,因此该方法对提高化合物半导体的纯度具有效果。版权所有:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH0532482A

    专利类型

  • 公开/公告日1993-02-09

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19910188583

  • 发明设计人 BUSSHU TERUO;OBE ISAO;

    申请日1991-07-29

  • 分类号C30B23/08;C23C14/32;C30B25/02;H01L21/203;

  • 国家 JP

  • 入库时间 2022-08-22 05:13:36

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