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Process for forming twin well CMOS integrated circuits

机译:形成双阱CMOS集成电路的工艺

摘要

A complementary insulated gate field effect transistor comprises a semiconductor body having an effectively planar surface, the semiconductor body containing complementary conductivity type wells in which complementary transistors are formed. A field insulator layer is selectively formed on the surface of the body, the field insulator layer being hardened against radiation. That portion of the planar surface of the body on which the field insulator layer is formed is not lower than respective surface portions on which first and second gate insulator layers of the complementary conductivity type transistors are formed. In addition to respective gates, and source and drain region pairs, the complementary transistors have insulative spacers which abut sidewalls of the first and second gates and the field insulator layer and extend over portions of the source and drain regions.
机译:互补绝缘栅场效应晶体管包括具有有效平坦表面的半导体本体,该半导体本体包含互补导电类型阱,在该互补导电类型阱中形成互补晶体管。场绝缘层选择性地形成在主体的表面上,该场绝缘层被硬化以抵抗辐射。主体的平坦表面上形成有场绝缘体层的那部分不低于其上形成有互补导电型晶体管的第一和第二栅极绝缘体层的各个表面部分。除了各自的栅极以及源极和漏极区域对之外,互补晶体管还具有绝缘隔离物,该绝缘隔离物邻接第一栅极和第二栅极的侧壁以及场绝缘体层并且在源极和漏极区域的一部分上延伸。

著录项

  • 公开/公告号US5247199A

    专利类型

  • 公开/公告日1993-09-21

    原文格式PDF

  • 申请/专利权人 HARRIS CORPORATION;

    申请/专利号US19920928992

  • 发明设计人 DYER A. MATLOCK;

    申请日1992-08-12

  • 分类号H01L27/02;H01L29/06;H01L29/10;H01L29/34;

  • 国家 US

  • 入库时间 2022-08-22 04:57:46

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