首页> 外国专利> A PLASMA CLEANING METHOD FOR REMOVING RESIDUES IN A PLASMA TREAMENT CHAMBER for removing residues in the plasma processing chamber

A PLASMA CLEANING METHOD FOR REMOVING RESIDUES IN A PLASMA TREAMENT CHAMBER for removing residues in the plasma processing chamber

机译:一种用于清除等离子体处理室中残留物的等离子体清洁方法,以去除等离子体处理室中的残留物

摘要

This is a plasma cleaning method for removing pre formed residues in the plasma treatment center by dry cleaning the same layer of photographers and barriers on silicon wafers.In this method, the mixture of oxidation gas and chlorine containing gas is put into kemburg, and then plasma cleaning process is carried out.The plasma cleaning process is to activate the net gas mixture and form the plasma cleaning gas, contact the internal surface of Kember with the plasma refined gas, and remove the residue on the internal surface.In addition, the clean gas mixture can also include fluorine-based gas.For example, the above clean gases may include C2, O2 and any CF4.The advantage of this method is that there is no need to open the plasma treatment system.In addition, all residues can be completely removed, and the by-products formed in the bonding process can be prevented from remaining after the end of the bonding process.
机译:这是一种等离子清洗方法,用于通过干法清洗硅晶片上相同层的光致抗蚀剂和阻挡层来去除等离子处理中心中预先形成的残留物,该方法是将氧化气体和含氯气体的混合物放入金堡,然后进行等离子清洗过程。等离子清洗过程是激活净气体混合物并形成等离子清洗气体,使Kember的内表面与等离子精制气体接触,并除去内表面上的残留物。清洁气体混合物也可以包含氟基气体,例如,上述清洁气体可以包含C2,O2和任何CF4,此方法的优点是无需打开等离子处理系统,此外,所有残留物可以将其完全除去,并且可以防止在粘合过程结束后残留在粘合过程中形成的副产物。

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