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Wet etching equipment and wet etching processing method

机译:湿蚀刻设备和湿蚀刻处理方法

摘要

PURPOSE:To eliminate damage of a transistor formed on a substrate by conducting a circular motion a holding base secured with the substrate with the surface of the substrate directed toward the center, and spraying etching solution or gas containing the solution to the substrate. CONSTITUTION:A chamber 30 is connected to a discharge system 33 and a gas introduction system 34, four arms 36 are extended in a cross state from a central shaft 35, susceptors 37 are attached around the arms 36, and rotated at an arbitrary speed. Eight pieces of 6-inch Si substrates 40 are secured to the inner wall of the post of the susceptor 37. The susceptor 37 is slowly accelerated up to 2000rpm, and held constantly. Then, valves 12, 25 are opened from a gas cylinder 10, and N2 gas containing etching solution is introduced to the chamber 30 via a nozzle 26. The jetted N2 gas is cooled to become foggy. The particles of the foggy etching solution are directed toward the surface of the substrate. Then, the valves 12, 25 are closed, and the chamber 30 is evacuated in vacuum by the system 33 simultaneously.
机译:目的:通过进行圆周运动来消除在基板上形成的晶体管的损坏,将固定在基板上的固定基座以基板表面指向中心,然后向基板喷涂蚀刻溶液或包含该溶液的气体。组成:一个腔室30连接到一个排放系统33和一个气体导入系统34,四个臂36从中心轴35交叉延伸,基座37围绕臂36固定,并以任意速度旋转。八块6英寸的Si衬底40固定到基座37的柱的内壁上。基座37缓慢地加速到2000rpm,并保持恒定。然后,从气瓶10打开阀12、25,并且将包含蚀刻溶液的N 2气体经由喷嘴26引入到腔室30中。喷射的N 2气体被冷却以变得有雾。有雾的蚀刻溶液的颗粒被导向基板的表面。然后,关闭阀12、25,并同时通过系统33将腔室30抽成真空。

著录项

  • 公开/公告号JPH088230B2

    专利类型

  • 公开/公告日1996-01-29

    原文格式PDF

  • 申请/专利权人 松下電器産業株式会社;

    申请/专利号JP19890124817

  • 发明设计人 上田 哲也;矢野 航作;

    申请日1989-05-18

  • 分类号H01L21/306;

  • 国家 JP

  • 入库时间 2022-08-22 04:00:36

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