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METHOD OF FORMING P-TYPE NITRIDE BASED III-V COMPOUND SEMICONDUCTOR LAYER

机译:基于P型氮化物的III-V族复合半导体层的形成方法

摘要

PROBLEM TO BE SOLVED: To provide method of forming a P-type nitride based III-V compound semiconductor layer which can bring an electrode into ohmic contact of low resistance with a P-type nitride based III-V compound semiconductor layer, while restraining generation of surface roughness, cracks, and deterioration of crystallinity of the semiconductor layer. ;SOLUTION: After a P-type nitride based III-V compound semiconductor layer, e.g. P-type GaN layer 3 is grown by an organic metal chemical vapor deposition method or the like, group II elements such as Mg and Zn are diffused on the surface of the layer 3 by a vapor diffusion method or a solid diffusion method, and a P+ type diffusion layer 4 is formed. The diffusion of group II elements is performed at, e.g. 500-700°C. Thereby an electrode can be brought into ohmic contact of low resistance with the P-type nitride based III-V compound semiconductor layer, while restraining generation of surface roughness, cracks, and deterioration of crystallinity of the semiconductor layer.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:提供一种形成P型氮化物基III-V族化合物半导体层的方法,该方法可以使电极与P型氮化物基III-V族化合物半导体层进行低电阻的欧姆接触,同时抑制产生半导体层的表面粗糙度,裂纹和结晶度的降低。 ;解决方案:在基于P型氮化物的III-V化合物半导体层之后,例如P型GaN层3通过有机金属化学气相沉积法等生长,Mg和Zn等II族元素通过气相扩散法或固体扩散法扩散在层3的表面上。形成P + 型扩散层4。 II族元素的扩散在例如50℃下进行。 500-700°C。从而可以使电极与P型氮化物基III-V族化合物半导体层进行低电阻的欧姆接触,同时抑制表面粗糙度,裂纹的产生和半导体层的结晶性的降低。;版权所有:(C) 1998年

著录项

  • 公开/公告号JPH1070082A

    专利类型

  • 公开/公告日1998-03-10

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19960244079

  • 申请日1996-08-27

  • 分类号H01L21/22;H01L21/203;H01L21/223;H01L21/285;

  • 国家 JP

  • 入库时间 2022-08-22 03:01:25

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