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Oxygen concentration control manner null of Si molten liquid for monocrystal pulling up

机译:单晶提拉硅熔液的氧浓度控制方式无效

摘要

PURPOSE: To obtain an Si single crystal having a specified oxygen concn. by adjusting the pressure of the atmosphere in contact with a molten Si doped with group V elements. ;CONSTITUTION: The molten Si doped with group V elements is placed in a crucible, and the oxygen concn. C2 (number of atoms/cm2) on the surface of molten Si is adjusted by the pressure P of the atmosphere in contact with the molten Si based on equation I. In this case, a constant K determined by the kind of the gaseous atmosphere and the doping atm. is 1.00-1.24 in the case of Ne when the doping amt. is ≥1.0×10-4 atomic %, 0.85-1.05 in the case of Ar, 0.64-0.80 in the case of Kr, 0.42-0.59 in the case of Xe and 0.30-0.38 in the case of Rn. The oxygen concn. is expressed in terms of JEIDA value (3.03). The oxygen concn. is more precisely controlled when the flow velocity V is fetched as a control factor. In this case, the pressure P (Torr) is controlled by the flow velocity V according to equation II, where (f) is determined by the radius of the crucible and is 1.0×103 to 3.5×105.;COPYRIGHT: (C)1995,JPO
机译:目的:获得具有特定氧浓度的Si单晶。通过调节与掺杂有V族元素的熔融Si接触的气氛的压力。 ;组成:将掺有V族元素的熔融Si放在坩埚中,并将氧气浓缩。熔融硅表面上的C 2 (原子数/ cm 2 )基于与方程式I相对应的大气压力P来调节。在这种情况下,常数K由气体气氛和掺杂大气压的种类确定。掺杂时,Ne为1.00-1.24。 ≥1.0×10 -4 原子%,Ar为0.85-1.05,Kr为0.64-0.80,Xe为0.42-0.59,Xe为0.30-0.38 Rn。氧气浓度用JEIDA值(3.03)表示。氧气浓度当获取流速V作为控制因素时,可以更精确地控制流量。在这种情况下,压力P(Torr)由流速V根据等式II进行控制,其中(f)由坩埚的半径确定,并且为1.0×10 3 至3.5× 10 5 .; COPYRIGHT:(C)1995,JPO

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