首页> 外国专利> A SEMICONDUCTOR DEVICE WITH A LOW RESISTANCE OHMIC CONTACT BETWEEN A METAL LAYER AND A SiC-LAYER

A SEMICONDUCTOR DEVICE WITH A LOW RESISTANCE OHMIC CONTACT BETWEEN A METAL LAYER AND A SiC-LAYER

机译:金属层与SiC层之间具有低电阻欧姆接触的半导体器件

摘要

The present invention is a semiconductor device comprising a semiconductor layer of SiC, a metal layer adapted to form a low resistance ohmic contact with the SiC-layer and a thin layer of a material having a smaller bandgap than the SiC of the SiC-layer and is placed between the SiC-layer and the metal layer. The SiC-layer is highly doped at least in the region next to the thin layer, and the material of the thin layer is a Group 3B-nitride including indium and at least another Group 3B-element.
机译:本发明是一种半导体器件,其包括SiC半导体层,适于与SiC层形成低电阻欧姆接触的金属层以及带隙比SiC层的SiC小的材料的薄层,并且在SiC层和金属层之间放置有硅。 SiC层至少在紧邻薄层的区域中被高度掺杂,并且薄层的材料是包括铟和至少另一个3B族元素的3B族氮化物。

著录项

  • 公开/公告号EP0875077A2

    专利类型

  • 公开/公告日1998-11-04

    原文格式PDF

  • 申请/专利权人 ABB RESEARCH LTD.;

    申请/专利号EP19970901298

  • 发明设计人 HARRIS CHRISTOPHER;

    申请日1997-01-17

  • 分类号H01L29/12;H01L29/45;

  • 国家 EP

  • 入库时间 2022-08-22 02:48:49

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