The present invention not only greatly improves the convenience and precision of real-time experiments by automating the thin film growth process in real time and at high speed using an optical multichannel analyzer (OMA) with many pixels. The present invention relates to a high-speed spectroscopic ellipsometer which can change the incident angle of light incident on a sample and enables real-time measurement of the thin film growth process at a desired incident angle. Rotating optical bench 20 is installed on one side and the fixed optical bench 30 is installed on the other side frame 40; The discharge lamp 21 to which the power supply device 25 is connected, the rotating polarizer 22 and the first aperture 23 in which the first optical encoder is installed is installed at one side, and the fixing part and the fine rotation adjusting part are provided at one side. The rotary optical bench 20 having 24; A fixing optical bench 30 having a light receiving unit to which an electronic control unit is connected, an analyzer 31 and a second aperture 32 provided with a second optical encoder on one side thereof; And it is characterized in that consisting of the fixed shaft 10, the sample mounting table 50 is installed on the top.
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