首页> 外国专利> Combined Low Voltage/High Voltage production method with retrograde doped drain extensions for high voltage transistors achieves simplified production and reduced costs

Combined Low Voltage/High Voltage production method with retrograde doped drain extensions for high voltage transistors achieves simplified production and reduced costs

机译:低压/高压生产方法与用于高压晶体管的反向掺杂漏极扩展相结合,可简化生产并降低成本

摘要

The method involves producing doped troughs (2) in a semiconducting substrate (1) and mounting semiconducting components for operation at a first voltage in the troughs. A second group of components for operation at a second, higher voltage with extension regions (3) are integrated into the semiconducting circuit. The first components are mounted in a first group of troughs of a number of troughs produced. The second group of components is arranged near other troughs of the troughs produced at the same time so that the other troughs form the extension regions of the higher voltage components
机译:该方法包括在半导体衬底(1)中产生掺杂的槽(2),以及在槽中以第一电压安装半导体组件以进行操作。用于在具有延伸区域(3)的第二较高电压下操作的第二组组件被集成到半导体电路中。将第一部件安装在所生产的多个槽的第一组槽中。第二组部件被布置在同时产生的槽的其他槽附近,使得其他槽形成较高电压部件的延伸区域。

著录项

  • 公开/公告号DE19928795A1

    专利类型

  • 公开/公告日2001-01-04

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE1999128795

  • 发明设计人 STRENZ ROBERT;

    申请日1999-06-23

  • 分类号H01L21/8238;H01L27/092;

  • 国家 DE

  • 入库时间 2022-08-22 01:10:26

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