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PRODUCTION METHOD FOR LATERAL MOSFET AND THE LATERAL MOSFET

机译:横向MOSFET的制造方法及横向MOSFET

摘要

PROBLEM TO BE SOLVED: To provide a lateral MOSFET and a production method therefor, with which costs can be reduced and time for delivery can be shortened. ;SOLUTION: On the main surface side of a semiconductor layer 3 composed of a p-type silicon layer on an insulation layer 2, ion implantation is conducted for controlling a threshold voltage (Figure 1 (a)). Afterwards, a gate oxide film 8 is formed on the main surface side of the semiconductor layer 3, a polysilicon film is deposited on the gate oxide film 8, and a patterned gate electrode 9 is formed by utilizing a mask (Figure 1 (b)). A mask member 41 composed of a resist layer is formed on the main surface side of the semiconductor layer 3 by utilizing the mask, and the ion implantation of impurities for forming an n-type semiconductor region 12 (refer to Figure 1 (d)) on one terminal side of the gate electrode 8 in the direction of gate length is performed by utilizing the gate electrode 9 as one part of the mask member (Figure 1 (c)). Such impurities are diffused, and the n-type semiconductor region 12 is formed with depth to the insulating layer 2 (Figure 1 (d)).;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:提供一种横向MOSFET及其制造方法,其可以降低成本并且可以缩短交货时间。 ;解决方案:在由绝缘层2上的p型硅层组成的半导体层3的主表面侧,进行离子注入以控制阈值电压(图1(a))。之后,在半导体层3的主表面侧上形成栅氧化膜8,在栅氧化膜8上淀积多晶硅膜,并利用掩模形成图形化的栅电极9(图1(b))。 )。利用该掩模,在半导体层3的主表面侧形成由抗蚀剂层构成的掩模部件41,并进行离子注入以形成n型半导体区域12的杂质(参照图1(d))。通过利用栅电极9作为掩模部件的一部分来进行沿栅长度方向在栅电极8的一个端子侧上的蚀刻(图1(c))。这样的杂质被扩散,并且n型半导体区域12形成到绝缘层2的深度(图1(d))。COPYRIGHT:(C)2003,JPO

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