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Circuits, systems, and methods for accounting for defective cells in a memory device
Circuits, systems, and methods for accounting for defective cells in a memory device
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机译:解决存储设备中缺陷单元的电路,系统和方法
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摘要
A data processing system 100 is provided which includes a memory 104, an array 204 of memory cells arranged in rows and columns, each row being addressable by an address. Address generation circuitry 201/202 is provided for generating ones of the addresses for accessing selected ones of the rows in the array 204. An associative memory 203 is coupled to the address generation circuitry 201/202 for translating a first address, received from the address generation circuitry 201/202 and addressing a defective one of the rows of the array 204, into a second address addressing an operative one of the rows in array 204, the second address being sent to the memory.
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