EVALUATING METHOD FOR CHARACTERISTICS OF SEMICONDUCTOR LASER DEVICE, TEST DEVICE FOR CHARACTERISTICS OF SEMICONDUCTOR LASER DEVICE, AND SEMICONDUCTOR LASER DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an evaluating method for characteristics of a semiconductor laser device, a test method for characteristics of a semiconductor laser device which can accurately evaluate magnitude of return optical noise.;SOLUTION: A laser beam is made incident on a CD 6 from a semiconductor laser device 1 through a collimator lens 2, a beam splitter 4, and an object lens 3, an optical signal including recording information of the CD6 reflected by this CD 6 is converted to an electric signal by a multi-division receiving element 8. The magnitude of return light noise of the semiconductor laser device is evaluated by a signal processor based on an average value and the maximum value of RF signals taken out from this electric signal.;COPYRIGHT: (C)2004,JPO