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Semiconductor memory device having duty cycle correction circuit and interpolation circuit interpolating clock signal in the semiconductor memory device

机译:具有占空比校正电路和内插电路的半导体存储器件,该内插电路在半导体存储器件中内插时钟信号

摘要

A semiconductor memory device having a duty cycle correction circuit and an interpolating circuit interpolating a clock signal in the semiconductor memory device are disclosed. The semiconductor memory device comprises a duty cycle correction circuit, which receives an external clock, corrects the duty cycle of the external clock, and outputs the corrected duty cycle. The duty cycle correction circuit comprises a first delay locked loop that receives the external clock, inverts the external clock, synchronizes the external clock with the inverted external clock, and outputs the synchronized clock; a second delay locked loop that receives the inverted external clock, synchronizes the inverted external clock with the external clock and outputs the synchronized clock; an inverting circuit that inverts the output signal of the first delay locked loop; an interpolation circuit that interpolates the output signal of the inverting circuit with the output signal of the second delay locked loop, and outputs the interpolated signal; and a control circuit that controls the interpolation circuit in response to the clock frequency information of the external clock.
机译:公开了一种具有占空比校正电路和内插电路的半导体存储器件,该内插电路在半导体存储器件中内插时钟信号。该半导体存储装置包括占空比校正电路,该占空比校正电路接收外部时钟,校正该外部时钟的占空比,并输出校正后的占空比。占空比校正电路包括第一延迟锁定环,该第一延迟锁定环接收外部时钟,将外部时钟反相,将外部时钟与反相的外部时钟同步,并输出同步的时钟。第二延迟锁定环,其接收反相的外部时钟,将反相的外部时钟与外部时钟同步,并输出同步后的时钟;反相电路,其将第一延迟锁定环的输出信号反相;内插电路,其将反相电路的输出信号与第二延迟锁定环的输出信号进行内插,并输出该内插信号;控制电路,其响应于外部时钟的时钟频率信息来控制内插电路。

著录项

  • 公开/公告号US2004062121A1

    专利类型

  • 公开/公告日2004-04-01

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD;

    申请/专利号US20030656303

  • 发明设计人 HOE-JU CHUNG;KYU-HYOUN KIM;

    申请日2003-09-04

  • 分类号G11C7/00;

  • 国家 US

  • 入库时间 2022-08-21 23:15:55

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