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Methods and devices for optimized digital and analog CMOS transistor performance in deep submicron technology

机译:在深亚微米技术中优化数字和模拟CMOS晶体管性能的方法和设备

摘要

High performance digital transistors (140) and analog transistors (144, 146) are formed at the same time. The digital transistors (140) include first pocket regions (134) for optimum performance. These pocket regions (134) are masked from at least the drain side of the analog transistors (144, 146) to provide a flat channel doping profile on the drain side. Second pocket regions (200) may be formed in the analog transistors. The flat channel doping profile provides high early voltage and higher gain.
机译:高性能数字晶体管( 140 )和模拟晶体管( 144、146 )同时形成。数字晶体管( 140 )包括第一口袋区域( 134 ),以实现最佳性能。这些袋区( 134 )至少从模拟晶体管( 144、146 )的漏极侧被掩盖,以在漏极侧提供平坦的沟道掺杂轮廓。第二口袋区域( 200 )可以形成在模拟晶体管中。平坦沟道掺杂曲线可提供较高的早期电压和较高的增益。

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