Integrated circuit with testing facility provided by test circuit performing test sequence for operative circuit of IC in response to test signal

摘要

The integrated circuit (1) has an operative circuit (2) and a test circuit (3), coupled to the operative circuit via control lines (4), for performing a given test sequence for the operative circuit in response to a test signal received by a test terminal (7) of the test circuit. A switching device (8) responds to activation of the test circuit by the test signal for coupling the test terminal to an internal voltage line (11). Also included are Independent claims for the following: (a) a test system for testing an integrated circuit; and (b) a method for activating a test function in an integrated circuit.