Test concept and experimental validation of the use of built-in-test to simplify conducted susceptibility testing of advanced technology integrated circuits and printed circuit boards

摘要

A description is given of the test concept and experimental validation of measurement techniques which exploit built-in-test (BIT) to simplify RF susceptibility measurements of complex digital integrated circuits (ICs) and printed circuit (PC) boards. The use of the BIT capability of VLSI devices and PC boards: (1) simplifies the hardware and software interfaces to the device-under-test; and (2) reduces the external test equipment requirements. A specific example is given as to how these techniques and procedures were applied to a self-testing Am2903 4-bit microprocessor slice test circuit. Test data are presented which demonstrate the feasibility of using BIT techniques to obtain susceptibility thresholds with a significant reduction in test complexity and external test equipment requirements. The limitations associated with using BIT techniques for susceptibility characterizations of ICs and PC boards are also addressed.