Instrumentation Facility for the Evaluation, Testing, and Packaging of Polymer Materials and Devices for Integrated Optical Circuits and Photonic Systems

摘要

This report describes the instrumentation facilities now available for the evaluation of new polymer materials for photonics and the measurement of polymer photonic devices. This new instrumentation was purchased and constructed using the funds from this DURIP Grant. The new facilities include attenuated total reflection and ellipsometric instrumentation for the measurement of electro-optic coefficients. Instrumentation for the measurement of thin film waveguide loss and material index of refraction by spectroscopic ellipsometery are also available. The high speed characterization of polymer devices using pico-second pulses at a wavelength of 1550 nm are now possible with this instrumentation.