This testing supports carrying several circuits integrated in operation, 1984, support provided with such circuits, integrated circuit adapted to be mounted on such a support and the test device for testing of such supports

摘要

P the manner of a function of the interconnection between two circuits integrated which are mounted are interlinked by links of information on a support, for example, provided with a wiring printed is. The circuits integrated are also connected to a serial bus for communication of test patterns and grounds for result from a test device, which may be connected and the respective circuits integrated. According to a preferred embodiment, the bus is formed by a bus called a in ic. According to a development, this arrangement can also be used to test the internal logic circuits integrated. In order to test the interconnection function, the cells of admissionevacuation are provided which comprise also a connection in parallel in order to fulfil, in a transparent mode, the function of embodiment of normal. In addition, they comprise connections in series, enabling communication of the patterns of testresultat in the manner of a register a spacing difference. / p