首页> 外国专利> Low-voltage - flash - eeprom - x - cell with fowler - north homes - tunneling

Low-voltage - flash - eeprom - x - cell with fowler - north homes - tunneling

机译:低压-闪光灯-eeprom-x-带捕蝇器的电池-北房屋-隧道

摘要

A low voltage flash EEPROM X-Cell includes an array of memory cell transistors (24) that constitute asymmetric floating gate memory cells wherein programming is achieved on only one side of the memory cells (24). The programming side of each of the memory cells (24) is connected to one of a plurality of Column Lines (28) at nodes (30). Each node (30) shares the programming side of two of the memory cells (24) and the non-programming side of two of the memory cells (24). The control gates of each of the memory cells (24) are connected to Word Lines (26) associated with rows of the array. To Flash Write all of the memory cells (24), the Column Lines (38) are connected to a negative medium voltage and the row lines (26) are connected to a positive medium voltage. To selectively erase one of the memory cells (24), the Column Line (28) associated with the programing side of the select memory cell transistor is connected to a positive medium voltage and the associated line (26) is connected to a positive Read voltage. The remaining Word Lines are connected to a negative Read voltage and the remaining Column Lines (28) are connected to a zero volt level.
机译:低压闪速EEPROM X单元包括构成非对称浮栅存储单元的存储单元晶体管(24)的阵列,其中仅在存储单元(24)的一侧上实现编程。每个存储单元(24)的编程侧在节点(30)处连接到多个列线(28)之一。每个节点(30)共享两个存储单元(24)的编程侧和两个存储单元(24)的非编程侧。每个存储单元(24)的控制栅极连接到与阵列的行相关联的字线(26)。为了对所有存储单元(24)进行闪存写入,列线(38)连接至负的中压,而行线(26)连接至正的中压。为了选择性地擦除其中一个存储单元(24),与选择存储单元晶体管的编程侧相关的列线(28)连接至正中电压,而相关线(26)连接至正读取电压。其余的字线连接到负读取电压,其余的列线(28)连接到零伏电平。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号