首页> 外国专利> Production of a very thin layer of a first material on a final substrate using a thick layer transfer thinned by implantation and fracture, notably for silicon on insulator structures

Production of a very thin layer of a first material on a final substrate using a thick layer transfer thinned by implantation and fracture, notably for silicon on insulator structures

机译:使用通过注入和断裂而变薄的厚层转移在最终基板上生产非常薄的第一材料层,特别是用于绝缘体结构上的硅

摘要

The production of a thin layer of a first material on a final substrate of a second material comprises: (a) fixing a thick layer of the first material on the final substrate along an interface; (b) implanting a gaseous species in the thick layer of first material to create a fragile zone delimiting, between the interface and the fragile zone, the thin layer; (c) depositing on the thick layer of first material a layer of a third material as a self-carrying layer; (d) fracturing the structure made up of the final substrate, the thick layer of first material and the layer of third material, at the level of the fragile zone to provide the substrate supporting the thin layer.
机译:在第二材料的最终基板上制造第一材料的薄层包括:(a)沿着界面将第一材料的厚层固定在最终基板上; (b)在第一材料的厚层中注入气态物质,以形成在界面和易碎区域之间界定薄层的易碎区域; (c)在第一材料的厚层上沉积第三材料的层作为自承载层; (d)在易碎区域的水平处使由最终基板,第一材料的厚层和第三材料的层组成的结构断裂,以提供支撑薄层的基板。

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