首页> 外国专利> Heterostructure e.g. silicon-on-insulator type substrate, fabricating method for e.g. optoelectronic field, involves subjecting heterostructure to ionic implantation operation using ions of atomic species within ferroelectric thin layer

Heterostructure e.g. silicon-on-insulator type substrate, fabricating method for e.g. optoelectronic field, involves subjecting heterostructure to ionic implantation operation using ions of atomic species within ferroelectric thin layer

机译:异质结构例如绝缘体上硅类型的衬底,例如,硅的制造方法。光电子领域涉及使用铁电薄层内的原子种类的离子对异质结构进行离子注入操作

摘要

The method involves subjecting a heterostructure to an ionic implantation operation using ions of atomic species within a ferroelectric thin layer (2), where the heterostructure is formed of piles of layers comprising a substrate (1) and the thin layer. The thin layer is realized in a material e.g. lithium tantalate and lithium niobate. The thin layer is supported by an electrode forming layer (3) made of metal chosen from chromium, aluminum, platinum, titanium and gold or non-metal such as carbon and low doped silicon. Faces of the thin layer are in contact with a barrier forming layer (4). The substrate is made up of semiconductor materials such as silicon, polysilicon and germanium.
机译:该方法包括使用铁电薄层(2)内的原子种类的离子对异质结构进行离子注入操作,其中异质结构由包括衬底(1)和薄层的层的堆形成。薄层由例如铝的材料实现。钽酸锂和铌酸锂。薄层由电极形成层(3)支撑,该电极形成层由选自铬,铝,铂,钛和金的金属或诸如碳和低掺杂硅的非金属制成。薄层的面与势垒形成层(4)接触。基板由诸如硅,多晶硅和锗的半导体材料制成。

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