首页> 外国专利> Field effect transistor improvable junction abruptness and method for manufacturing the same

Field effect transistor improvable junction abruptness and method for manufacturing the same

机译:场效应晶体管可改善的结突变及其制造方法

摘要

While preventing the short channel effect, discloses a field effect transistor and a method of manufacturing the same capable of improving the on-current of the transistor. Field effect transistor of the present invention is disclosed, the device isolation film for defining an active region is formed as a gate electrode is formed on a predetermined portion of the semiconductor substrate. And a channel layer is located at the bottom of the gate electrode, a gate oxide film between the gate electrode and the channel layer is sandwiched. Both sides of such a channel layer is formed on the source and drain regions. In this case, the boundary is the source and drain regions and the channel forming layer constitutes a substantially vertical with respect to the semiconductor substrate surface.
机译:在防止短沟道效应的同时,公开了一种场效应晶体管及其制造方法,其能够改善晶体管的导通电流。公开了本发明的场效应晶体管,当在半导体衬底的预定部分上形成栅电极时,形成用于限定有源区的器件隔离膜。沟道层位于栅电极的底部,在栅电极和沟道层之间夹有栅氧化膜。这样的沟道层的两侧形成在源极和漏极区域上。在这种情况下,边界是源极和漏极区域,并且沟道形成层构成相对于半导体衬底表面基本上垂直。

著录项

  • 公开/公告号KR100604870B1

    专利类型

  • 公开/公告日2006-07-31

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20040044512

  • 申请日2004-06-16

  • 分类号H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 21:23:22

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号