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Single event upset tolerant memory cell layout

机译:单粒子翻转容错存储单元的布局

摘要

Half cells of single-event-upset-tolerant memory cells are offset by at least two rows in a memory array. Offsetting the half cells separates them to avoid simultaneous damage to both half cells from a high-energy particle that could otherwise alter multiple nodes and corrupt the data state of the memory cell. Separating the half cells by at least two rows avoids corruption that could occur if diagonally arranged half cells were hit by a high-energy particle. In a particular embodiment, offset half cells are used at the top and bottom, respectively, of two adjacent columns of memory half cells.
机译:容忍单个事件失败的存储单元的一半单元在存储阵列中至少偏移了两行。使半个单元偏移会使它们分开,以避免同时被高能粒子损坏两个半单元,否则它们可能会更改多个节点并破坏存储单元的数据状态。将半电池分隔至少两行,可以避免在对角排列的半电池被高能粒子撞击时可能发生的损坏。在特定实施例中,分别在存储半单元的两个相邻列的顶部和底部使用偏移半单元。

著录项

  • 公开/公告号US7139190B1

    专利类型

  • 公开/公告日2006-11-21

    原文格式PDF

  • 申请/专利权人 JAN L. DE JONG;

    申请/专利号US20050152503

  • 发明设计人 JAN L. DE JONG;

    申请日2005-06-14

  • 分类号G11C11/00;

  • 国家 US

  • 入库时间 2022-08-21 20:59:53

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