首页> 外国专利> Detection method of particle percolation structure in two-phase composites and two-phase composites using the detection method

Detection method of particle percolation structure in two-phase composites and two-phase composites using the detection method

机译:利用该检测方法的两相复合物和两相复合物中的粒子渗滤结构的检测方法

摘要

The present invention relates to an insulating material as a base, two-phase composite formed by a conductive material in the second phase material within the structure of the prediction method ipcha percolation and accordingly provides a two-phase composite material having a second phase of forming the percolation structure, the optimal amount. Prediction method of the two-phase composite material within the particle percolation structure in accordance with the present invention, by specifying the region to be the horizontal size (X) and vertical size (Y) different from the second appointed by the size of the hexagonal lattice place, be placed in the given area second on the minor axis (d) and for setting the aspect ratio of the second major axis on the (a) and specifies the number on the first 2 (n), and be disposed in the inclination ( ) and a designated area for the second image on the second location coordinates (x, y) repeatedly is disposed a second phase in the specified area by specifying the. And calculate the amount of the arrangement when the second phase up to a saturated state in the given area to the amount placed. Two-phase composites according to the present invention and the insulating material to the base, consists of a conductive material and a second phase, wherein, if the percolation structure of the second phase is to be formed to be made to overlap the second inter-phase, the second phase When the aspect ratio of the particles that make up 59% is 1, 5, when 43%, 20 19%, and when any one of the 100 when 4% is formed by the minimum amount arrangement. Also when the overlap is formed so as to be made the second phase-to-phase, when the second aspect ratio of the particles that make up the phase is 1 to 45.2%, 5 days when 40%, 20 when 26.5% 100 9.8% when any one of the is formed by placing the maximum amount.
机译:本发明涉及一种绝缘材料作为基础的两相复合材料,其由预测方法ipcha渗滤的结构内的第二相材料中的导电材料形成,并相应地提供了一种具有第二形成相的两相复合材料。渗滤结构,最佳用量。通过指定与六边形尺寸指定的第二尺寸不同的水平尺寸(X)和垂直尺寸(Y)的区域,根据本发明的颗粒渗透结构内的两相复合材料的预测方法格子位置,放置在短轴(d)上第二个给定区域中,并在(a)上设置第二个主轴的长宽比,并在第一个2上指定数字(n),并放置在通过指定倾斜度()和第二位置坐标(x,y)上第二图像的指定区域,将第二相位重复地指定在指定区域中。并计算在给定区域内第二相达到饱和状态时的布置量。根据本发明的两相复合材料和基底的绝缘材料,由导电材料和第二相组成,其中,如果要形成第二相的渗滤结构以使其与第二中间相重叠,相,第二相当组成最小含量的颗粒的长径比为1、5、43%,20%,19%,100个中的任意一个,当4%通过最小量排列形成时,第二相。另外,在形成为第二相相重叠的情况下,构成相的粒子的第二长径比为1〜45.2%时,为40%时为5天,为26.5%时为20时100 9.8当通过放置最大数量形成任意一个时,%。

著录项

  • 公开/公告号KR100666339B1

    专利类型

  • 公开/公告日2007-01-09

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20040072860

  • 发明设计人 이준희;신순기;

    申请日2004-09-13

  • 分类号G06F17/50;

  • 国家 KR

  • 入库时间 2022-08-21 20:33:12

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号