首页> 外国专利> DETECTION METHOD OF PARTICLE PERCOLATION STRUCTURE IN TWO-PHASE COMPOSITES AND TWO-PHASE COMPOSITES USING THE DETECTION METHOD

DETECTION METHOD OF PARTICLE PERCOLATION STRUCTURE IN TWO-PHASE COMPOSITES AND TWO-PHASE COMPOSITES USING THE DETECTION METHOD

机译:两相复合材料和两相复合材料颗粒渗透结构的检测方法

摘要

The present invention provides an insulating material as a base, two-phase complex formed by an electrically conductive material in a second phase ipcha percolation structure of the material in the prediction method and accordingly provides a two-phase composite material that has a two-phase forming the percolation structure, the optimum amount. Prediction of the two-phase composite material in particle percolation structure in accordance with the present invention, specify the area to be the horizontal size (X) and vertical size (Y) different from the second prescribed by the size of the hexagonal lattice place, it is placed in a specified area, 2 on the minor axis (d) and for setting the aspect ratio of the second major axis on the (a) and specifies the number of the first 2 (n), and be disposed in the inclination ( ) and a designated area for the second image on the second location coordinates (x, y) repeatedly is disposed a second phase in the specified area by specifying the. And calculate the amount of the arrangement when the second phase up to saturation in the designated area to the amount placed. 2, the composite according to the present invention and the insulating material to the base, consists of an electrically conductive material and a second phase, wherein, if the percolation structure of the second phase is to be formed to be made to overlap the second phase, the second phase When the aspect ratio of the particles constituting the 59% one day, 5 days the 43%, 20 19%, and when any one of the 100 when 4% is formed by the minimum amount arrangement. And when the overlap is formed so as to be made the second phase, when the second aspect ratio of the particles constituting the phase is 1, 45.2%, 40.0%, when the 5th, 20th, when 26.5% 100 9.8% when any one of the It is formed by placing the maximum amount.
机译:本发明提供了一种绝缘材料作为基础的两相复合物,其由预测方法中的材料的第二相ipcha渗滤结构中的导电材料形成,并且相应地提供了具有两相的两相复合材料。形成最佳的渗滤结构。根据本发明对颗粒渗流结构中的两相复合材料的预测,指定该区域的水平尺寸(X)和垂直尺寸(Y)与六边形格子位置尺寸所规定的第二尺寸不同,将其放置在指定区域中,在短轴(d)上为2,并在(a)上设置第二个主轴的长宽比,并指定第一个2的数量(n),并以倾斜度放置(),然后通过指定,将第二位置在第二位置坐标(x,y)上的第二图像的指定区域重复放置在指定区域中。并计算第二阶段达到饱和时在指定区域内放置的布置数量。如图2所示,根据本发明的复合材料和与基底的绝缘材料由导电材料和第二相组成,其中,如果要形成第二相的渗滤结构以使其与第二相重叠,第二相:当构成细颗粒的长径比为一天的59%,5天为43%,20天为19%时,以及当100个中的任何一个以4%的比例通过最小量排列形成时。并且,在形成为第二相的重叠的情况下,构成该相的粒子的第二长径比为1、45.2%,40.0%,第5、20时,26.5%,100.8%时。它通过放置最大数量而形成。

著录项

  • 公开/公告号KR20060024036A

    专利类型

  • 公开/公告日2006-03-16

    原文格式PDF

  • 申请/专利权人 DONG-A UNIVERSITY;

    申请/专利号KR20040072860

  • 发明设计人 LEE JUN HEE;SHIN SOON GI;

    申请日2004-09-13

  • 分类号G06F17/50;

  • 国家 KR

  • 入库时间 2022-08-21 21:26:15

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号