首页> 外国专利> Method of manufacturing and structure of polycrystalline semiconductor thin-film heterostructures on dissimilar substrates

Method of manufacturing and structure of polycrystalline semiconductor thin-film heterostructures on dissimilar substrates

机译:在不同衬底上的多晶半导体薄膜异质结构的制造方法和结构

摘要

According to various exemplary embodiments of this invention, a method of producing a semiconductor structure is provided that includes providing a layered structure on a first substrate, the layered structure including a silicon layer that is provided over a first dielectric layer, a first dielectric layer that is provided over an etch-stop layer, the etch-stop layer provided over a buffer layer, the buffer layer provided over a sacrificial layer, and a sacrificial layer provided over a first substrate. Moreover, various exemplary embodiments of the methods of this invention provide for a second substrate over the layered structure, separating the first substrate and the sacrificial layer from the buffer layer, separating the buffer layer and the etch-stop layer from the first dielectric layer and providing a drain electrode and a source electrode over the layered structure. Moreover, according to various exemplary embodiments of the devices of this invention, a transistor device is provided that includes a substrate, a gate electrode over the substrate, a laser recrystallized polycrystalline semiconductor layer over the gate electrode and a source electrode and a drain electrode over the laser recrystallized polycrystalline semiconductor. Finally, according to various exemplary embodiments of the devices of this invention, a transistor device is provided that includes a substrate, a laser recrystallized polycrystalline semiconductor over the substrate, a source electric and a drain electrode over the laser recrystallized polycrystalline semiconductor and a gate electrode over the source electrode and the drain electrode.
机译:根据本发明的各种示例性实施例,提供了一种制造半导体结构的方法,该方法包括在第一基板上提供层状结构,该层状结构包括设置在第一电介质层,第一电介质层上方的硅层。在蚀刻停止层上提供蚀刻停止层,在缓冲层之上提供蚀刻停止层,在牺牲层之上提供缓冲层,以及在第一基板之上提供牺牲层。此外,本发明方法的各种示例性实施例在层状结构上提供第二衬底,将第一衬底和牺牲层与缓冲层分开,将缓冲层和蚀刻停止层与第一介电层分开,并且在层状结构上提供漏极和源极。而且,根据本发明的器件的各种示例性实施例,提供了一种晶体管器件,该晶体管器件包括衬底,在衬底之上的栅电极,在栅电极之上的激光重结晶的多晶半导体层以及在栅电极之上的源极和漏极。激光重结晶的多晶半导体。最后,根据本发明的器件的各种示例性实施例,提供了一种晶体管器件,该晶体管器件包括衬底,在衬底上方的激光重结晶的多晶半导体,在激光重结晶的多晶半导体上方的源极和漏极以及栅电极。在源电极和漏电极上。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号