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Semiconductor memory device having full depletion type logic transistors and partial depletion type memory transistors

机译:具有全耗尽型逻辑晶体管和部分耗尽型存储晶体管的半导体存储器件

摘要

A semiconductor device includes a semiconductor substrate, an insulating layer, a silicon layer, full depletion type transistors, and partial depletion type transistors. The insulating layer is formed on the Semiconductor substrate. The silicon layer has a first region and a second region. The silicon layer is formed on the insulating layer. The full depletion type transistors are used for a logical circuit, and are formed on the silicon layer at the first region. The partial depletion type transistors are used for a memory cell circuit and are formed on the silicon layer at he second region. The second region of the silicon layer is maintained at a fixed potential.
机译:半导体器件包括半导体衬底,绝缘层,硅层,全耗尽型晶体管和部分耗尽型晶体管。绝缘层形成在半导体衬底上。硅层具有第一区域和第二区域。硅层形成在绝缘层上。全耗尽型晶体管用于逻辑电路,并形成在第一区域的硅层上。部分耗尽型晶体管用于存储单元电路,并形成在第二区域的硅层上。硅层的第二区域保持在固定电势。

著录项

  • 公开/公告号US7507610B2

    专利类型

  • 公开/公告日2009-03-24

    原文格式PDF

  • 申请/专利权人 MASAHIRO YOSHIDA;

    申请/专利号US20050271980

  • 发明设计人 MASAHIRO YOSHIDA;

    申请日2005-11-14

  • 分类号H01L21/00;H01L21/84;

  • 国家 US

  • 入库时间 2022-08-21 19:29:54

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